A fast BEM for the analysis of damaged structures with...

A fast BEM for the analysis of damaged structures with bonded piezoelectric sensors

I. Benedetti, M.H. Aliabadi, A. Milazzo
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Volume:
199
Year:
2010
Language:
english
Pages:
12
DOI:
10.1016/j.cma.2009.09.007
File:
PDF, 705 KB
english, 2010
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