Challenges and potential of new approaches for reliability assessment of nanotechnologies
Laurent Béchou, Yves Danto, Jean-Yves Deletage, Frédéric Verdier, Yannick Deshayes, Sébastien Fregonèse, Cristell Maneux, Thomas Zimmer, Dominique LaffitteVolume:
9
Year:
2008
Pages:
15
DOI:
10.1016/j.crhy.2007.12.001
File:
PDF, 1.13 MB
2008