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Reactivity at the film/solution interface of ex situ prepared bismuth film electrodes: A scanning electrochemical microscopy (SECM) and atomic force microscopy (AFM) investigation
Samo B. Hočevar, Salvatore Daniele, Carlo Bragato, Božidar OgorevcVolume:
53
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.electacta.2007.07.035
File:
PDF, 523 KB
english, 2007