Growth and characterization of highly oriented CuBr thin...

Electrochimica Acta 2008 Vol. 54; Iss. 2

Growth and characterization of highly oriented CuBr thin films through room temperature electrochemical route

He Li, Run Liu, Honglan Kang, Yifang Zheng, Zhude Xu
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Volume:
54
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.electacta.2008.08.006
File:
PDF, 665 KB
english, 2008
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