![](/img/cover-not-exists.png)
Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble
Yi-Hung Liu, Szu-Hsien Lin, Yi-Ling Hsueh, Ming-Jiu LeeVolume:
36
Year:
2009
Language:
english
Pages:
21
DOI:
10.1016/j.eswa.2007.12.015
File:
PDF, 2.33 MB
english, 2009