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Integrating RFID with quality assurance system – Framework and applications
Jung Lyu Jr., Shiow-Yun Chang, Tung-Liang ChenVolume:
36
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.eswa.2009.01.082
File:
PDF, 282 KB
english, 2009