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Examination of Be//Cu joints in hipped Be tiles by using Ion Beam Analysis methods
E. De Vito, H. Khodja, C. Cayron, P. LorenzettoVolume:
82
Year:
2007
Language:
english
Pages:
10
DOI:
10.1016/j.fusengdes.2007.03.031
File:
PDF, 3.65 MB
english, 2007