Extended data analysis strategies for high resolution...

International Journal of Mass Spectrometry 2007 Vol. 260; Iss. 2-3

Extended data analysis strategies for high resolution imaging MS: New methods to deal with extremely large image hyperspectral datasets

Leendert A. Klerk, Alexander Broersen, Ian W. Fletcher, Robert van Liere, Ron M.A. Heeren
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Volume:
260
Year:
2007
Language:
english
Pages:
15
DOI:
10.1016/j.ijms.2006.11.014
File:
PDF, 2.83 MB
english, 2007
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