Electron work function decrease in SIMS analysis induced by...

Electron work function decrease in SIMS analysis induced by neutral cesium deposition

P. Philipp, T. Wirtz, H.-N. Migeon, H. Scherrer
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Volume:
264
Year:
2007
Language:
english
Pages:
14
DOI:
10.1016/j.ijms.2007.03.019
File:
PDF, 1.63 MB
english, 2007
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