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Precise isotopic measurements of sub-nanogram Nd of standard reference material by thermal ionization mass spectrometry using the NdO+ technique
Chao-Feng Li, Fukun Chen, Xiang-Hui LiVolume:
266
Year:
2007
Language:
english
Pages:
8
DOI:
10.1016/j.ijms.2007.06.013
File:
PDF, 360 KB
english, 2007