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Enhanced feature analysis using wavelets for scanning probe microscopy images of surfaces
Alisher Maksumov, Ruxandra Vidu, Ahmet Palazoglu, Pieter StroeveVolume:
272
Year:
2004
Language:
english
Pages:
13
DOI:
10.1016/j.jcis.2003.09.047
File:
PDF, 1.09 MB
english, 2004