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Microwave reflection intensity measurement for dielectric material using a single probe
Hirofumi Kakemoto, Satoshi Wada, Takaaki TsurumiVolume:
26
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.jeurceramsoc.2005.09.105
File:
PDF, 266 KB
english, 2006