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Angular and NiFe thickness dependence of exchange bias in IrMn/NiFe/IrMn thin film
Yong-Goo Yoo, Seong-Gi Min, Ho-Jun Ryu, Nam-Seok Park, Seong-Cho YuVolume:
303
Year:
2006
Language:
english
Pages:
1
DOI:
10.1016/j.jmmm.2006.01.051
File:
PDF, 126 KB
english, 2006