![](/img/cover-not-exists.png)
Transformation of arbitrary distributions to the normal distribution with application to EEG test–retest reliability
S.J. van Albada, P.A. RobinsonVolume:
161
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.jneumeth.2006.11.004
File:
PDF, 360 KB
english, 2007