Displacive disorder and dielectric relaxation in the...

Displacive disorder and dielectric relaxation in the stoichiometric bismuth-containing pyrochlores, Bi2MIIINbO7 (M=In and Sc)

Yun Liu, Ray L. Withers, Hai Binh Nguyen, Kim Elliott, Qijun Ren, Zhanghai Chen
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Volume:
182
Year:
2009
Language:
english
Pages:
8
DOI:
10.1016/j.jssc.2009.07.007
File:
PDF, 753 KB
english, 2009
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