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Comparison of impedance measurements in a DSP using ellipse-fit and seven-parameter sine-fit algorithms
Pedro M. Ramos, Fernando M. Janeiro, Tomáš RadilVolume:
42
Year:
2009
Language:
english
Pages:
10
DOI:
10.1016/j.measurement.2009.05.005
File:
PDF, 1012 KB
english, 2009