Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure
A. Tatarogˇlu, Ş. Altındal, M.M. BülbülVolume:
81
Year:
2005
Language:
english
Pages:
10
DOI:
10.1016/j.mee.2005.04.008
File:
PDF, 210 KB
english, 2005