A novel approach to resistivity and interconnect modeling

Microelectronic Engineering 2006 Vol. 83; Iss. 11-12

A novel approach to resistivity and interconnect modeling

Y. Travaly, M. Bamal, L. Carbonell, F. Iacopi, M. Stucchi, M. Van Hove, G.P. Beyer
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
83
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2006.10.048
File:
PDF, 267 KB
english, 2006
Conversion to is in progress
Conversion to is failed