A demonstration of the effectiveness of a single aberration...

Micron 2011 Vol. 42; Iss. 4

A demonstration of the effectiveness of a single aberration correction per optical slice in beam scanned optically sectioning microscopes

Simon P. Poland, Amanda J. Wright, Stuart Cobb, Jacob C. Vijverberg, John M. Girkin
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Volume:
42
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.micron.2010.05.018
File:
PDF, 591 KB
english, 2011
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