Latchup in voltage tolerant circuits: a new phenomenon

Microelectronics Reliability 2004 Vol. 44; Iss. 4

Latchup in voltage tolerant circuits: a new phenomenon

Jorge Salcedo-Suñer, Charvaka Duvvury, Roger Cline, Alfonso Cadena-Hernandez
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Volume:
44
Year:
2004
Language:
english
Pages:
14
DOI:
10.1016/j.microrel.2003.12.004
File:
PDF, 831 KB
english, 2004
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