High voltage applications and NBTI effects of DT-pMOSFETS...

Microelectronics Reliability 2005 Vol. 45; Iss. 7-8

High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts

Yao-Jen Lee, Tien-Sheng Chao, Tiao-Yuan Huang
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Volume:
45
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2005.01.002
File:
PDF, 193 KB
english, 2005
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