Degradation mechanisms of GaAs PHEMTs in high humidity...

Microelectronics Reliability 2005 Vol. 45; Iss. 12

Degradation mechanisms of GaAs PHEMTs in high humidity conditions

Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2005.01.017
File:
PDF, 272 KB
english, 2005
Conversion to is in progress
Conversion to is failed