Characterization of a 0.13 μm CMOS Link Chip using Time...

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Characterization of a 0.13 μm CMOS Link Chip using Time Resolved Emission (TRE)

Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steve Wilson, Phil Wu, Alberto Tosi
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Volume:
45
Year:
2005
Pages:
4
DOI:
10.1016/j.microrel.2005.07.062
File:
PDF, 1.46 MB
2005
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