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Electroluminescence spectroscopy for reliability investigations of 1.55 μm bulk semiconductor optical amplifier
S. Huyghe, L. Bechou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, J.L. Goudard, Y. DantoVolume:
45
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2005.07.067
File:
PDF, 495 KB
english, 2005