Reliability of Contacts for Press-Pack High-Power Devices

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Reliability of Contacts for Press-Pack High-Power Devices

J. Vobecký, D. Kolesnikov
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Volume:
45
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2005.07.076
File:
PDF, 945 KB
english, 2005
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