Automated setup for thermal imaging and electrical...

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Automated setup for thermal imaging and electrical degradation study of power DMOS devices

M. Heer, V. Dubec, M. Blaho, S. Bychikhin, D. Pogany, E. Gornik, M. Denison, M. Stecher, G. Groos
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Volume:
45
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2005.07.082
File:
PDF, 682 KB
english, 2005
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