Hydrogen in MOSFETs – A primary agent of reliability issues
Sokrates T. Pantelides, L. Tsetseris, S.N. Rashkeev, X.J. Zhou, D.M. Fleetwood, R.D. SchrimpfVolume:
47
Year:
2007
Language:
english
Pages:
9
DOI:
10.1016/j.microrel.2006.10.011
File:
PDF, 1.29 MB
english, 2007