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Characterization of semiconductor interfaces using a modified mixed mode bending apparatus
J. Thijsse, O. van der Sluis, J.A.W. van Dommelen, W.D. van Driel, M.G.D. GeersVolume:
48
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2007.06.003
File:
PDF, 287 KB
english, 2008