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Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs
D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, N. StojadinovićVolume:
47
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2007.07.022
File:
PDF, 378 KB
english, 2007