Analysis of ESD protection structure behaviour after ageing...

Microelectronics Reliability 2007 Vol. 47; Iss. 9-11

Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices

Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu
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Volume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.07.042
File:
PDF, 450 KB
english, 2007
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