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Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology
Michael Heer, Krzysztof Domański, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang StadlerVolume:
49
Year:
2009
Language:
english
Pages:
10
DOI:
10.1016/j.microrel.2009.06.052
File:
PDF, 2.04 MB
english, 2009