Correlation between EOS customer return failure cases and...

Microelectronics Reliability 2009 Vol. 49; Iss. 9-11

Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method

Jean Luc Lefebvre, Christian Gautier, Frédéric Barbier
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Volume:
49
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2009.07.030
File:
PDF, 873 KB
english, 2009
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