Percolation theory applied to PZT thin films capacitors breakdown mechanisms
M.T. Chentir, J.-B. Jullien, B. Valtchanov, E. Bouyssou, L. Ventura, C. AnceauVolume:
49
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2009.07.048
File:
PDF, 1013 KB
english, 2009