Geometric design for ultra-long needle probe card for digital light processing wafer testing
Hao-Yuan Chang, Wen-Fung Pan, Meng-Kai Shih, Yi-Shao LaiVolume:
50
Year:
2010
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2009.11.013
File:
PDF, 782 KB
english, 2010