Physically based models of electromigration: From Black’s equation to modern TCAD models
R.L. de Orio, H. Ceric, S. SelberherrVolume:
50
Year:
2010
Language:
english
Pages:
15
DOI:
10.1016/j.microrel.2010.01.007
File:
PDF, 916 KB
english, 2010