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Impedance and barrier capacitance of silicon diodes implanted with high-energy Xe ions
N.A. Poklonski, N.I. Gorbachuk, S.V. Shpakovski, V.A. Filipenia, S.B. Lastovskii, V.A. Skuratov, A. Wieck, V.P. MarkevichVolume:
50
Year:
2010
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2010.02.007
File:
PDF, 407 KB
english, 2010