Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime
Antonio Raffo, Sergio Di Falco, Giovanna Sozzi, Roberto Menozzi, Dominique M. M.-P. Schreurs, Giorgio VanniniVolume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.08.010
File:
PDF, 581 KB
english, 2011