AlGaN/GaN High Electron Mobility Transistor degradation...

Microelectronics Reliability 2011 Vol. 51; Iss. 2

AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress

E.A. Douglas, C.Y. Chang, D.J. Cheney, B.P. Gila, C.F. Lo, Liu Lu, R. Holzworth, P. Whiting, K. Jones, G.D. Via, Jinhyung Kim, Soohwan Jang, Fan Ren, S.J. Pearton
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.09.024
File:
PDF, 890 KB
english, 2011
Conversion to is in progress
Conversion to is failed