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In situ diffraction profile analysis during tensile deformation motivated by molecular dynamics
H. Van Swygenhoven, Ž. Budrović, P.M. Derlet, A.G. Frøseth, S. Van PetegemVolume:
400-401
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.msea.2005.03.041
File:
PDF, 240 KB
english, 2005