Critical doping requirements for ≤65 nm device...

Critical doping requirements for ≤65 nm device manufacturing

Sandeep Mehta, Ukyo Jeong, Jinning Liu, Baonian Guo
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Volume:
114-115
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mseb.2004.07.038
File:
PDF, 348 KB
english, 2004
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