Cathodoluminescence assessment of annealed silicon and a novel technique for estimating minority carrier lifetime in silicon
K.J. Fraser, R.J. Falster, P.R. WilshawVolume:
159-160
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.mseb.2008.05.006
File:
PDF, 224 KB
english, 2009