Inspection of defects in conductive multi-layered...

NDT & E International 2006 Vol. 39; Iss. 7

Inspection of defects in conductive multi-layered structures by an eddy current scanning technique: Simulation and experiments

Pingjie Huang, Guangxin Zhang, Zhaotong Wu, Jinhui Cai, Zekui Zhou
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Volume:
39
Year:
2006
Language:
english
Pages:
7
DOI:
10.1016/j.ndteint.2006.04.004
File:
PDF, 643 KB
english, 2006
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