Rapid flaw depth estimation from SQUID-based eddy current...

NDT & E International 2007 Vol. 40; Iss. 4

Rapid flaw depth estimation from SQUID-based eddy current nondestructive evaluation

M. Pattabiraman, R. Nagendran, M.P. Janawadkar
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Volume:
40
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.ndteint.2006.12.003
File:
PDF, 659 KB
english, 2007
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