Pulsed eddy current imaging and frequency spectrum analysis for hidden defect nondestructive testing and evaluation
Yunze He, Mengchun Pan, Feilu Luo, Guiyun TianVolume:
44
Year:
2011
Language:
english
Pages:
9
DOI:
10.1016/j.ndteint.2011.01.009
File:
PDF, 2.03 MB
english, 2011