Pulsed eddy current imaging and frequency spectrum analysis...

Pulsed eddy current imaging and frequency spectrum analysis for hidden defect nondestructive testing and evaluation

Yunze He, Mengchun Pan, Feilu Luo, Guiyun Tian
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Volume:
44
Year:
2011
Language:
english
Pages:
9
DOI:
10.1016/j.ndteint.2011.01.009
File:
PDF, 2.03 MB
english, 2011
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