A six-circle diffractometer system for synchrotron X-ray...

A six-circle diffractometer system for synchrotron X-ray studies of surfaces and thin film growth by molecular beam epitaxy

Hawoong Hong, T.-C. Chiang
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Volume:
572
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.nima.2006.11.056
File:
PDF, 733 KB
english, 2007
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