Analysis of artificial silicon microstructures by...

Analysis of artificial silicon microstructures by ultra-small-angle and spin-echo small-angle neutron scattering

M. Trinker, E. Jericha, W.G. Bouwman, R. Loidl, H. Rauch
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Volume:
579
Year:
2007
Language:
english
Pages:
9
DOI:
10.1016/j.nima.2007.06.008
File:
PDF, 603 KB
english, 2007
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