Elemental mapping by means of an ultra-fast XRF...

Elemental mapping by means of an ultra-fast XRF spectrometer based on a novel high-performance monolithic array of Silicon Drift Detectors

R. Alberti, C. Fiorini, C. Guazzoni, T. Klatka, A. Longoni
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Volume:
580
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.nima.2007.06.056
File:
PDF, 397 KB
english, 2007
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