Total Ionizing Dose effects in 130-nm commercial CMOS...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2007 Vol. 582; Iss. 3

Total Ionizing Dose effects in 130-nm commercial CMOS technologies for HEP experiments

L. Gonella, F. Faccio, M. Silvestri, S. Gerardin, D. Pantano, V. Re, M. Manghisoni, L. Ratti, A. Ranieri
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Volume:
582
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2007.07.068
File:
PDF, 280 KB
english, 2007
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