Characterization and application of a GE amorphous silicon...

Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

J.H. Lee, J. Almer, C. Aydιner, J. Bernier, K. Chapman, P. Chupas, D. Haeffner, K. Kump, P.L. Lee, U. Lienert, A. Miceli, G. Vera
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Volume:
582
Year:
2007
Language:
english
Pages:
3
DOI:
10.1016/j.nima.2007.08.103
File:
PDF, 188 KB
english, 2007
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