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Application of ion beams in the study of depth profiling of...

Application of ion beams in the study of depth profiling of nitrogen

Lakshmanan H. Vanamurthy, Arthur W. Haberl, Hassaram Bakhru
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Volume:
261
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.nimb.2007.03.043
File:
PDF, 237 KB
english, 2007
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